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A comprehensive textbook on the testing and measurement of analog, digital, mixed-signal and RF integrated circuits; written for advanced undergraduates, graduate students, and professionals. The book presents both theory and industrial-standard test methods, covering tester hardware, DC and parametric measurements, data analysis and probabilistic reasoning, ADC/DAC testing, sampling theory, analog and RF testing, serial-data and clock-channel measurements, and design-for-test (DfT) strategies — with numerous worked examples and guidance for modern semiconductor production testing.

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245: $a: An Introduction to Mixed-Signal IC Test and Measurement
245: $b:
082: $a:
100: $a: Mark Burns & Gordon W. Roberts
650: $a: Electrical Engineering
250: $a:
440: $v:
250: $b: Oxford University Press
250: $c: 2001
020: $a: 9780195140163
300: $a: 704