IOU Library

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

An electronic copy of book is available for Library Members

Further Details Info

Title	VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
Call No
Authors	Laung-Terng Wang , Cheng-Wen Wu , Xiaoqing Wen
Subjects	Computer Science

An electronic copy of book is available for Library Members Sign in to view the book

Morgan Kaufmann

no reviews

Sub Title:
Edition:
Volume:
Publisher:
Publishing Year: 2010
ISBN:
Pages:

245: $a: VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
245: $b:
082: $a:
100: $a: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
650: $a: Computer Science
250: $a:
440: $v:
250: $b:
250: $c: 2010
020: $a:
300: $a:

Welcome to IOU Digital Library

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

Further Details Info

Fresh Arrivals