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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

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Title	Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Call No
Authors	Alvin W. Strong , Ernest Y. Wu , Rolf-Peter Vollertsen , Jordi Sune , Giuseppe La Rosa , Timothy D. Sullivan , Stewart E. Rauch III
Subjects	ISBN-13:; 9780471731726

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Wiley-IEEE Press

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Publishing Year: 2009
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245: $a: Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
245: $b:
082: $a:
100: $a: Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III
650: $a: ISBN-13:; 9780471731726
250: $a:
440: $v:
250: $b:
250: $c: 2009
020: $a:
300: $a:

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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

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