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Wiley-IEEE Press
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Publishing Year: 2009
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245: $a: Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
245: $b:
082: $a:
100: $a:Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III
650: $a:ISBN-13:; 9780471731726
250: $a:
440: $v:
250: $b:
250: $c: 2009
020: $a:
300: $a:
