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Page 1 | Results on this page: 7 | Digital Books: 7 | Physical Books: 0

Advances in Military Sociology: Essays in Honour of Charles C. Moskos, Part A
Advances in Military Sociology: Essays in Honour of Charles C. Moskos, Part A

Subjects: 9781848558908

Published in: 2010

Availability: 1 of 1(eBook)

By: Caforio ,  Giuseppe

Complex Networks - CompleNet 2010 (Communications in Computer and Information Science, 116)
Complex Networks - CompleNet 2010 (Communications in Computer and Information Science, 116)

Subjects: Springer 2011,  3642255000 9783642255007

Published in: 101

Availability: 1 of 1(eBook)

By: Luciano da F. Costa ,  Alexandre Evuskoff ,  Giuseppe Mangioni ,  Ronaldo Menezes

Human Computer Confluence
Human Computer Confluence

Subjects: Technology

Published in: 2016

Availability: 1 of 1(eBook)

By: Andrea Gaggioli & Alois Ferscha & Giuseppe Riva & Stephen Dunne & Isabelle Viaud-Delmon

Image Analysis and Processing -- ICIAP 2011: 16th International Conference, Ravenna, Italy, September 14-16, 2011, Proceedings, Part II (Lecture Notes in Computer Science)
Image Analysis and Processing -- ICIAP 2011: 16th International Conference, Ravenna, Italy, September 14-16, 2011, Proceedings, Part II (Lecture Notes in Computer Science)

Subjects: Springer 2011,  3642240879 9783642240874

Published in: 101

Availability: 1 of 1(eBook)

By: Giuseppe Maino ,  Gian Luca Foresti (Editors)

LNAI 4659 - Resilience in the Face of Disaster: Accounting for Varying Disaster Magnitudes, Resource Topologies, and (Sub)Population Distributions in the PLAN C Emergency Planning Tool
LNAI 4659 - Resilience in the Face of Disaster: Accounting for Varying Disaster Magnitudes, Resource Topologies, and (Sub)Population Distributions in the PLAN C Emergency Planning Tool

Subjects: Holonic and Multi-Agent Systems for Manufacturing

Published in: 101

Availability: 1 of 1(eBook)

By: Giuseppe Narzisi ,  Joshua S. Mincer ,  Silas Smith

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

Subjects: ISBN-13:,  9780471731726

Published in: 2009

Availability: 1 of 1(eBook)

By: Alvin W. Strong ,  Ernest Y. Wu ,  Rolf-Peter Vollertsen ,  Jordi Sune ,  Giuseppe La Rosa ,  Timothy D. Sullivan ,  Stewart E. Rauch III

The Economics of Ethics and the Ethics of Economics
The Economics of Ethics and the Ethics of Economics

Subjects:

Published in: 2009

Availability: 1 of 1(eBook)

By: Brennan ,  Geoffrey ,  Eusepi ,  Giuseppe

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