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Reliability Wearout Mechanisms in Advanced CMOS Technologies
Reliability Wearout Mechanisms in Advanced CMOS Technologies

Subjects: Microelectronics

Published in: 2009

Availability: 1 of 1(eBook)

By: Alvin W. Strong ,  Ernest Y. Wu ,  Rolf-Peter Vollertsen ,  Jordi Suné ,  Giuseppe La Rosa ,  Stewart E. Rauch III ,  and Timothy D. Sullivan

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