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Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

Subjects: ISBN-13:,  9780471731726

Published in: 2009

Availability: 1 of 1(eBook)

By: Alvin W. Strong ,  Ernest Y. Wu ,  Rolf-Peter Vollertsen ,  Jordi Sune ,  Giuseppe La Rosa ,  Timothy D. Sullivan ,  Stewart E. Rauch III

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